Sensor Integration in Embedded Systems

Abstract

Complex Embedded Systems rely heavily on sensors and actuators (CES). Catastrophic events can occur in these CES if the sensors or actuators malfunction. System performance can be severely impacted if a sensor or actuator malfunctions, which is difficult to detect. Integration testing of the 'Subsystem under test (SUT)' with sensors or actuators is necessary to ensure that the 'Embedded Processing Component (EPC)' meets specifications. In order to properly integrate sensors and actuators into the overall system, it is necessary to detect and correct any failure modes that may arise. Diagnosing a defective machine in a series of two CFSM requires conducting sensor/actuator integration testing within ES. The diagnostic methodology is utilised to find a solution to the problem at hand. Integrating sensors and actuators is just one part of the larger diagnostic challenge. It is becoming increasingly necessary in the age of IoT to have a solid foundation in areas such as signal processing, artificial intelligence, and multi-media communication in order to effectively use embedded systems based on mobile sensor technology. "Defective process " is used to describe a communication channel that has a faulty communication channel, which alters or possibly modifies events between the fault-free processes. The use of functional tests in integration testing ensures that the known and tested system requirements are appropriately identified. It is possible to determine whether an integration test is successful or unsuccessful by comparing the actual output with the expected response across a communication channel.