Reliability Modeling for Sensor Systems

Abstract

In key developing industries like automotive and industrial, sensor dependability is now one of the most crucial hurdles for widespread use of Internet-of-things data. To model sensor dependability under diverse load circumstances, the research provides a method based on the Bayes theorem. To ensure the system's long-term viability, it has been tested for both hardware and communication problems. Using several handbooks, we were able to anticipate the failure rate of self-designed and self-developed nodes intended for usage in hard settings.